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£99.00
Woodhead Publishing Scanning Nonlinear Dielectric Microscopy - Woodhead Publishing
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Description
Key Features
Authored by the inventor to provide an authoritative and accurate guide on scanning nonlinear dielectric microscopy techniques.
Provides methods for the measurement of ferroelectric materials at the atomic scale for high-precision research.
Enables high-sensitivity visualization and measurement of semiconductor materials and devices.
Acts as a definitive reference for characterizing ferroelectric, dielectric, and semiconductor materials.
Part of the Woodhead Publishing Series in Electronic and Optical Materials for specialized technical study.
Product Specifications
- Brand
- Woodhead Publishing
- Format
- paperback
- ASIN
- 0128172460
- Domain
- Amazon UK
- Release Date
- 01 June 2020
- Listed Since
- 01 October 2019
Barcode
No barcode data available
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