£124.89

Woodhead Publishing Scanning Nonlinear Dielectric Microscopy - Woodhead Publishing

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£124.89 £100.59 £105.89 £111.19 £116.50 £121.80 £127.10 26 January 2026 06 February 2026 17 February 2026 28 February 2026 11 March 2026

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18 days 26 days 1 day · current 0 7 13 20 26 £103 £105 £125 Days at Price

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Most common price: £105 (26 days, 57.8%)

Price range: £103 - £125

Price levels: 3 different prices over 45 days

Description

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices serves as the definitive reference for researchers and engineers. This technical volume provides a deep look into a vital tool used to characterize essential materials in modern electronics. Written by the original inventor of the technique, this book offers an authoritative perspective on applying microscopy to key material applications. It covers the measurement of ferroelectric materials at the atomic scale and provides methods for the visualization and measurement of semiconductor materials and devices with high levels of sensitivity. By exploring new insights and established methods, this text helps professionals understand the practical implementation of scanning nonlinear dielectric microscopy. It is an essential addition to the Woodhead Publishing Series in Electronic and Optical Materials for those working in the fields of semiconductor research and material science.

Key Features

Authored by the inventor to provide an authoritative and accurate guide on scanning nonlinear dielectric microscopy techniques.

Provides methods for the measurement of ferroelectric materials at the atomic scale for high-precision research.

Enables high-sensitivity visualization and measurement of semiconductor materials and devices.

Acts as a definitive reference for characterizing ferroelectric, dielectric, and semiconductor materials.

Part of the Woodhead Publishing Series in Electronic and Optical Materials for specialized technical study.

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