£66.00

Südwestdeutscher Verlag für Hochschulschriften Scanning Capacitance Microscopy: and Spectroscopy on Semiconductor Materials

Price data last checked 51 day(s) ago - refreshing...

View at Amazon

We'll watch every seller, every day. One email when your price arrives.

It has never been this cheap. We have no record of a lower price.

£66 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey
↓ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 40 days • 40 data points (No recent data available)

Historical
Generating forecast...
£66.00 £62.70 £64.02 £65.34 £66.66 £67.98 £69.30 12 March 2026 21 March 2026 31 March 2026 10 April 2026 20 April 2026

Price Distribution

Price distribution over 40 days • 1 price levels

Days at Price
40 days 0 10 20 30 40 £66 Days at Price

Price Analysis

Most common price: £66 (40 days, 100.0%)

Price range: £66 - £66

Price levels: 1 different prices over 40 days

Description

In this PhD-thesis, Scanning Capacitance Microscopy(SCM) and Scanning Capacitance Spectroscopy (SCS) was appliedto investigate various silicon samples. SCM is used to investigatethe electrical behaviour of samples with a lateral resolution below100 nm. The work is divided into 3 major experimental parts: (1)the properties of metal organic chemical vapour deposited zirconiumdioxide as dielectric material for SCM was explored. Usage ofzirconium dioxide leads to reduced leakage currents andimproved signal quality. (2) focussed ion beam induced damage insilicon was investigated with SCM. The beam shape and the rangeof ion damage inside the sample was investigated. The SCMdata were compared with transmission electron microscopy data.(3) a setup for quantitative Scanning Capacitance Spectroscopywith an external capacitance bridge connected to an atomic forcemicroscope was designed. This setup is sensitive enough to resolvethe energetic distribution of interface trapped charges and toquantitatively measure the local oxide charge density distributionof zirconium dioxide layers.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
20 January 2009
Listed Since
23 March 2009

Barcode

No barcode data available

Similar Products You Might Like

Capacitance Spectroscopy of Semiconductors
96% match

Capacitance Spectroscopy of Semiconductors

Taylor & Francis

£109.79 18 Feb 2026
Wiley-Blackwell Advanced Electronic Packaging Book
96% match

Wiley-Blackwell Advanced Electronic Packaging Book

Wiley-Blackwell

£124.00 18 Apr 2026
Thin-Film Capacitors for Packaged Electronics
95% match

Thin-Film Capacitors for Packaged Electronics

Springer

£75.56 05 Feb 2026
Adv Dielectric CT Vol 174: Proceedings of the 107th Annual Meeting of The American Ceramic Society, Baltimore, Maryland, USA 2005 (Ceramic Transactions Series)
95% match

Adv Dielectric CT Vol 174: Proceedings of the 107th Annual Meeting of The American Ceramic Society, Baltimore, Maryland, USA 2005 (Ceramic Transactions Series)

Wiley

£96.90 09 Mar 2026
Dielectrics in Electric Fields: Tables, Atoms, and Molecules
95% match

Dielectrics in Electric Fields: Tables, Atoms, and Molecules

CRC Press

£192.44 08 Jan 2026
Dielectric Polymer Materials for High-Density Energy Storage (Plastics Design Library)
95% match

Dielectric Polymer Materials for High-Density Energy Storage (Plastics Design Library)

William Andrew

£128.16 25 Jan 2026
Growth of High Permittivity Dielectrics by High Pressure Sputtering from Metallic Targets (Springer Theses)
95% match

Growth of High Permittivity Dielectrics by High Pressure Sputtering from Metallic Targets (Springer Theses)

Springer

£73.85 08 Mar 2026
Advances in Electroceramic Materials II: 221 (Ceramic Transactions Series)
95% match

Advances in Electroceramic Materials II: 221 (Ceramic Transactions Series)

Wiley

£107.00 09 Mar 2026
Develop Dielectric CT V 167: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004 (Ceramic Transactions Series)
95% match

Develop Dielectric CT V 167: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004 (Ceramic Transactions Series)

Wiley

£127.79 10 Mar 2026
Electrical Measurements: Introduction, Concepts and Applications
95% match

Electrical Measurements: Introduction, Concepts and Applications

£252.99 08 Jan 2026
Recent Advances in Dielectric Materials
94% match

Recent Advances in Dielectric Materials

£217.79 11 Jan 2026
Handbook of Silicon Carbide Materials and Devices (Series in Materials Science and Engineering)
94% match

Handbook of Silicon Carbide Materials and Devices (Series in Materials Science and Engineering)

£104.00 11 Jan 2026
Frontal Semiconductor Research
94% match

Frontal Semiconductor Research

£196.02 09 Mar 2026
High Permittivity Gate Dielectric Materials: 43 (Springer Series in Advanced Microelectronics, 43)
94% match

High Permittivity Gate Dielectric Materials: 43 (Springer Series in Advanced Microelectronics, 43)

Springer

£97.13 05 Apr 2026
Electroceramics VI '98
94% match

Electroceramics VI '98

Elsevier

£208.79 14 Feb 2026
Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)
94% match

Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)

£79.66 04 Mar 2026
Nanoscale Ferroelectric-Multiferroic Materials for Energy Harvesting Applications (Micro and Nano Technologies)
94% match

Nanoscale Ferroelectric-Multiferroic Materials for Energy Harvesting Applications (Micro and Nano Technologies)

Elsevier

£132.95 09 Mar 2026
Dielectric Phenomena in Solids
94% match

Dielectric Phenomena in Solids

Academic Press

£84.80 09 Apr 2026
New Developments in Semiconductor Research
94% match

New Developments in Semiconductor Research

Brand: Nova Science Pub Inc

£12.99 16 Mar 2026
Microwave Materials and Applications, 2 Volume Set (Wiley Series in Materials for Electronic & Optoelectronic Applications)
94% match

Microwave Materials and Applications, 2 Volume Set (Wiley Series in Materials for Electronic & Optoelectronic Applications)

Wiley

£299.76 06 Feb 2026
Springer - Fundamental Aspects of Ultrathin Dielectrics on Si
94% match

Springer - Fundamental Aspects of Ultrathin Dielectrics on Si

Springer

£122.06 24 Feb 2026
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164
94% match

Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164

CRC Press

£471.29 19 Apr 2026
Introduction to the Electronic Properties of Materials
94% match

Introduction to the Electronic Properties of Materials

CRC Press

£175.79 08 Apr 2026