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£50.00
LAP Lambert Academic Publishing Design for Yield and Reliability for Nanometer CMOS Digital Circuits: Statistical design, Soft errors modeling, Adaptive body bias, Negative capacitance circuits
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Product Specifications
- Format
- paperback
- ASIN
- 365951361X
- Domain
- Amazon UK
- Publication Date
- 26 January 2014
- Listed Since
- 27 January 2014
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