£173.63

Springer Positron Annihilation in Semiconductors: Defect Studies: 127 (Springer Series in Solid-State Sciences, 127)

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Description

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
21 January 1999
Listed Since
16 December 2006

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