Positron Annihilation in Semiconductors: Defect Studies: 127 (Springer Series in Solid-State Sciences, 127) - Image 1

£143.74

Springer Positron Annihilation in Semiconductors: Defect Studies: 127 (Springer Series in Solid-State Sciences, 127)

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Analytical Chemistry

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Description

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.

Product Specifications

Brand: Springer
Format: hardcover
ASIN: 3540643710
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Analytical Chemistry
Domain: Amazon UK
Release Date: 21 January 1999
Listed Since: 16 December 2006

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Springer Positron Annihilation in Semiconductors: Defect Studies: 127 (Springer Series in Solid-State Sciences, 127)

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