Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance (Springer Theses) - Image 1

£75.84

Springer Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance (Springer Theses)

Name: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance (Springer Theses)
Brand: Springer
Price: 75.84 GBP
Availability: InStock

Physical Chemistry

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Description

This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

Product Specifications

Brand: Springer
Format: Paperback
ASIN: 331903328X
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Physical Chemistry
Domain: Amazon UK
Release Date: 09 August 2015
Listed Since: 10 August 2015

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