We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£65.37
De Gruyter Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS (De Gruyter STEM)
Price data last checked 39 day(s) ago - refreshing...
Price History & Forecast
Last 52 days • 52 data points (No recent data available)
Price Distribution
Price distribution over 52 days • 8 price levels
Price Analysis
Most common price: £62 (12 days, 23.1%)
Price range: £60 - £66
Price levels: 8 different prices over 52 days
Description
Product Specifications
- Brand
- De Gruyter
- Format
- perfect
- ASIN
- 3110456214
- Domain
- Amazon UK
- Release Date
- 17 December 2018
- Listed Since
- 23 September 2017
Barcode
No barcode data available
Similar Products You Might Like
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Springer
The Rietveld Method (International Union of Crystallography Monographs on Crystallography): 5
Oxford University Press
International Tables for Crystallography, Volume H: Powder Diffraction (IUCr Series. International Tables for Crystallography)
Wiley
STRUC DET FROM POWDER DIFFRACTION DATA IUCRMC:NCS 13 PAPER (International Union of Crystallography Monographs on Crystallography)
Oxford University Press
Introduction to X-Ray Powder Diffractometry: 158 (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)
Wiley
Crystal Structure Determination
Springer
High Resolution X-Ray Diffractometry And Topography
CRC Press
High Resolution X-Ray Diffractometry And Topography
CRC Press
X-Ray Diffraction Procedures: For Polycrystalline and Amorphous Materials (Wiley-Interscience Publication)
Wiley
The Basics of Crystallography and Diffraction (International Union of Crystallography Texts on Crystallography)
Oxford University Press
X-Ray Diffraction for Materials Research: From Fundamentals to Applications
Crystallography
Wiley
Electron Crystallography: Electron Microscopy and Electron Diffraction: 16 (International Union of Crystallography Texts on Crystallography)
Oxford University Press
X-Ray Diffraction for Materials Research: From Fundamentals to Applications
CRC Press
Einführung in die Kristallographie: Eine Einführung (De Gruyter Studium)
De Gruyter
Introduction to the Characterization of Residual Stress by Neutron Diffraction
CRC Press
Characterization of Solid Polymers: New techniques and developments
Springer
Introduction to Crystal Growth and Characterization
Wiley
Oxford University Press - Atomic Pair Distribution Function Analysis
Oxford University Press
Solid-State Chemistry (De Gruyter Textbook)
De Gruyter
Structure Determination by X-ray Crystallography
Springer
Two-dimensional X-ray Diffraction
Wiley
Morphology of Crystals: Part A: Fundamentals Part B: Fine Particles, Minerals and Snow Part C: The Geometry of Crystal Growth by Jaap van Suchtelen (Materials Science of Minerals and Rocks)
Springer
Basic Elements of Crystallography
Taylor & Francis