Noise in Nanoscale Semiconductor Devices - Image 1

£46.00

Springer Noise in Nanoscale Semiconductor Devices

Name: Noise in Nanoscale Semiconductor Devices
Brand: Springer
Price: 46.0 GBP
Availability: InStock

Circuits

It has never been this cheap. We have no record of a lower price.

£46 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 80 days · 80 data points (no recent data)

Historical

Generating forecast…

Price Distribution

Price distribution over 80 days • 7 price levels

Days at Price

Current Price

Price Analysis

Most common price: £47 (21 days, 26.3%)

Price range: £46 - £62

Price levels: 7 different prices over 80 days

Description

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models. From the Back Cover This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models. About the Author Prof. Tibor Grasser is an IEEE Fellow and has been the head of the Institute for Microelectronics since 2016. He has edited various books, e.g. on advanced device modeling (World Scientific), the bias temperature instability (Springer) and hot carrier degradation (Springer), is a distinguished lecturer of the IEEE EDS, is a recipient of the Best and Outstanding Paper Awards at IRPS (2008, 2010, 2012, and 2014), IPFA (2013 and 2014), ESREF (2008) and the IEEE EDS Paul Rappaport Award (2011). He currently serves as an Associate Editor for the IEEE Transactions on Electron Devices following his assignment as Associate Editor for Microelectronics Reliability (Elsevier) and has been involved in various outstanding conferences such as IEDM, IRPS, SISPAD, ESSDERC, and IIRW. Prof. Grasser's current research interests include theoretical modeling of performance aspects of 2D and 3D devices (charge trapping, reliability), starting from the ab initio level over more efficient quantum-mechanical descriptions up to TCAD modeling. The models developed in his group have been made available in the most important commercial TCAD environments.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 3030375021
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Circuits
Domain: Amazon UK
Release Date: 27 April 2021
Listed Since: 31 March 2021

Barcode

No barcode data available

Springer Noise in Nanoscale Semiconductor Devices

It has never been this cheap. We have no record of a lower price.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Fundamentals Of Nanotransistors: 6 (Lessons from Nanoscience: A Lecture Notes Series)

Gettering Defects in Semiconductors: 19 (Springer Series in Advanced Microelectronics, 19)

Intelligent Integrated Systems: Devices, Technologies, and Architectures: 01 (Jenny Stanford Series on Intelligent Nanosystems)

Modeling And Electrothermal Simulation Of SiC Power Devices: Using Silvaco© Atlas

Frontiers In Electronics: Advanced Modeling Of Nanoscale Electron Devices: 54 (Selected Topics in Electronics and Systems)

3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics

Electronics: Basic, Analog, and Digital with PSpice

CRC Press Nanoscale Devices: Physics, Modeling, and Applications

Introducing Technology Computer-Aided Design (TCAD): Fundamentals, Simulations, and Applications

New Developments in Semiconductor Research

Trends in Semiconductor Research

Microsystems for Bioelectronics: Scaling and Performance Limits (Revised) (Micro & Nano Technologies)

Growth of High Permittivity Dielectrics by High Pressure Sputtering from Metallic Targets (Springer Theses)

Frontal Semiconductor Research

Frontiers in Electronics - Selected Papers from The Workshop on Frontiers In Electronics 2015 (WOFE-15): 57 (Selected Topics in Electronics and Systems)

New Research on Semiconductors - Nova Science Publishers Inc

Direktmontage: Handbuch über die Verarbeitung ungehäuster ICs

Springer 3D Microelectronic Packaging - Advanced Microelectronics

Microelectronics Manufacturing Diagnostics Handbook

Springer Handbook of Semiconductor Devices

Selected Advances in Nanoelectronic Devices: Logic, Memory and RF: 175 (Lecture Notes in Electrical Engineering, 175)

Frontiers In Electronics: Selected Papers From The Workshop On Frontiers In Electronics 2013 (Wofe-2013): Frontiers in Electronics Selected Papers ... (Selected Topics in Electronics and Systems)