We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£111.02
Springer Defect and Fault Tolerance in VLSI Systems: Volume 2
Price data last checked 50 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£111 today · previous high £111 · all-time low £110
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 41 days · 41 data points (no recent data)
Price Distribution
Price distribution over 41 days • 2 price levels
Price Analysis
Most common price: £110 (28 days, 68.3%)
Price range: £110 - £111
Price levels: 2 different prices over 41 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1475799594
- Domain
- Amazon UK
- Publication Date
- 05 May 2013
- Listed Since
- 20 September 2013
Barcode
No barcode data available
Similar Products You Might Like
Testing and Reliable Design of CMOS Circuits: 88 (The Springer International Series in Engineering and Computer Science, 88)
Springer
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing, 34)
Springer
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications: 5 (Frontiers in Electronic Testing, 5)
Springer
Testing and Reliable Design of CMOS Circuits: 88 (The Springer International Series in Engineering and Computer Science, 88)
Springer
Interconnects in VLSI Design
Springer
Design Automation for Timing-Driven Layout Synthesis: 198 (The Springer International Series in Engineering and Computer Science, 198)
Springer
Design Automation for Timing-Driven Layout Synthesis: 198 (The Springer International Series in Engineering and Computer Science, 198)
Springer
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science, 89)
Springer
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
Springer
Energy-Efficient Fault-Tolerant Systems (Embedded Systems)
Springer
Machine Learning in VLSI Computer-Aided Design
Springer
Multi-Level Simulation for VLSI Design: 18 (The Springer International Series in Engineering and Computer Science, 18)
Springer
Introduction to VLSI Process Engineering
Springer
Energy-Efficient Fault-Tolerant Systems (Embedded Systems)
Springer
Emerging VLSI Devices, Circuits and Architectures: Proceedings of the 27th International Symposium, VDAT 2023: 1234 (Lecture Notes in Electrical Engineering, 1234)
Springer
Wafer-Level Integrated Systems: Implementation Issues: 70 (The Springer International Series in Engineering and Computer Science, 70)
Springer
Switch-Level Timing Simulation of MOS VLSI Circuits: 66 (The Springer International Series in Engineering and Computer Science)
Springer
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Springer
Signal Propagation on Interconnects
Springer
VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers: 1066 (Communications in Computer and Information Science, 1066)
Springer
System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches: Volume 2 Knowledge-Based and Fault-Tolerant Techniques Proceedings of ... Rhodes, Greece, August 31–September 3, 1986
Springer
Relaxation Techniques for the Simulation of VLSI Circuits: 20 (The Springer International Series in Engineering and Computer Science, 20)
Springer
Interconnection Noise in VLSI Circuits
Springer
VLSI-SOC: From Systems to Chips: IFIP TC 10/WG 10.5, Twelfth International Conference on Very Large Scale Ingegration of System on Chip (VLSI-SoC ... and Communication Technology, 200)
Springer