£73.67

Springer Electrothermal Analysis of VLSI Systems

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£74 today · all-time low £73 (Feb 2026) · usually £76

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Description

Product Description This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis. Review From the Foreword: `Continuing increases in the levels of circuit integration and concomitant increases in performance are sustaining the trend of increasing power dissipation in VLSI systems. A consequence is that the impact of temperature on the successful operation and reliability of devices must be comprehended during the design process.....This text provides a comprehensive formulation of the electrothermal analysis problem beginning with a summary of the sources of power dissipation in CMOS circuits and followed by a formulation of the effect of temperature on MOS devices. ' Dr. Ralph K. Cavin, Vice President, Semiconductor Research Corporation

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
20 April 2013
Listed Since
22 September 2013

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