£81.95

Advances in X-Ray/EUV Optics and Components VIII (Proceedings of SPIE)

Applied Optics

Price data last checked 50 day(s) ago - refreshing...

View at Amazon

Price History & Forecast

Last 41 days • 41 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 41 days • 1 price levels

Days at Price

Price Analysis

Most common price: £82 (41 days, 100.0%)

Price range: £82 - £82

Price levels: 1 different prices over 41 days

Product Specifications

Format: paperback
ASIN: 0819496987
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 30 November 2013
Listed Since: 21 June 2013

Barcode

No barcode data available

Advances in X-Ray/EUV Optics and Components VIII (Proceedings of SPIE)

Price History & Forecast

Price Distribution

Price Analysis

Product Specifications

Barcode

Similar Products You Might Like

Advances in X-ray/EUV Optics, Components and Applications (Proceedings of SPIE)

Optical Diagnostics and Sensing VIII (Proceedings of SPIE)

Electro-optical and Infrared Systems: Technology and Applications VIII (Proceedings of SPIE)

Advances in Computational Methods for X-Ray and Neutron Optics (Proceedings of SPIE)

Penetrating Radiation Systems and Applications VIII: 8 (Proceedings of SPIE)

Hard X-ray and Gamma-ray Detector Physics and Penetrating Radiation Systems: Pt. VIII (Proceedings of SPIE)

Laser Technology VIII: Progress in Lasers (Proceedings of SPIE)

Optical Fibers and Sensors for Medical Diagnostics and Treatment Applications VIII (Proceedings of SPIE)

Optical Measurement Systems for Industrial Inspection VIII (Proceedings of SPIE)

Photonic Devices and Algorithms for Computing: Pt. VIII (Proceedings of SPIE)

Eighth Symposium Optics in Industry

Liquid Crystals: VIII (Proceedings of SPIE)

X-ray and Neutron Capillary Optics II (Proceedings of SPIE)

X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X (Proceedings of SPIE)

Advances in Metrology for X-ray and EUV Optics II: 2 (Proceedings of SPIE)

Image Processing: Algorithms and Systems VIII (Proceedings of SPIE)

X-Ray Nanoimaging: Instruments and Methods (Proceedings of SPIE)

Free-space Laser Communications VIII (Proceedings of SPIE)

Color Imaging: Processing, Hardcopy and Applications VIII (Proceedings of SPIE)

Applications of Artificial Neural Networks in Image Processing: VIII (Proceedings of SPIE)

Fiber Optic Sensors and Applications VIII

Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics and Applications (Proceedings of SPIE)

Organic Photovoltaics VIII (Proceedings of SPIE)

Chemical and Biological Sensing VIII (Proceedings of SPIE)