We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£115.00
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 3 months
Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 71 days · 71 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 71 days • 1 price levels
Price Analysis
Most common price: £115 (71 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 71 days
Description
Product Specifications
- Format
- paperback
- ASIN
- 0819459267
- Domain
- Amazon UK
- Release Date
- 31 August 2005
- Listed Since
- 03 March 2009
Barcode
No barcode data available
Similar Products You Might Like
Advances in X-ray/EUV Optics, Components and Applications (Proceedings of SPIE)
Advanced Optics for Defense Applications: UV through LWIR II (Proceedings of SPIE)
Advances in Computational Methods for X-Ray and Neutron Optics (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)
Advances in X-Ray/Euv Optics and Components Vi
Advances in Slow and Fast Light (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXI (Proceedings of SPIE)
Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)
Damage to VUV, EUV, and X-ray Optics (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XX: 20 (Proceedings of SPIE)
Optical Microlithography XX (Proceedings of SPIE)
Three-dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV (Proceedings of SPIE)
Modeling Aspects in Optical Metrology IV (Proceedings of SPIE)
Illumination Optics (Proceedings of SPIE)
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV (Proceedings of SPIE)
Nano- and Micro-metrology (Proceedings of SPIE)
Confocal, Multiphoton and Nonlinear Microscopic Imaging (Proceedings of SPIE)
Optical Microlithography XXI (Proceedings of SPIE)
Ultrafast Nonlinear Imaging and Spectroscopy (Proceedings of SPIE)
Lightmetry and Light and Optics in Biomedicine (Proceedings of SPIE)
X-Ray Nanoimaging: Instruments and Methods (Proceedings of SPIE)
Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits (Proceedings of SPIE)
X-ray and Neutron Capillary Optics II (Proceedings of SPIE)
