£115.00

Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)

Applied Optics

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Format: Paperback
ASIN: 0819459267
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 31 August 2005
Listed Since: 03 March 2009

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Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)

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