We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£115.00
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 3 months
Three-dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV (Proceedings of SPIE)
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 49 days · 49 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 49 days • 1 price levels
Price Analysis
Most common price: £115 (49 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 49 days
Description
Product Specifications
- Format
- paperback
- ASIN
- 0819470368
- Domain
- Amazon UK
- Release Date
- 11 February 2008
- Listed Since
- 05 February 2009
Barcode
No barcode data available
Similar Products You Might Like
Optical Pattern Recognition XV (Proceedings of SPIE)
Optical Microlithography XX (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXI (Proceedings of SPIE)
Confocal, Multiphoton and Nonlinear Microscopic Imaging (Proceedings of SPIE)
Machine Vision Applications in Industrial Inspection XV (Proceedings of SPIE)
Optical Microlithography XXI (Proceedings of SPIE)
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XX: 20 (Proceedings of SPIE)
Optical Microlithography XIX (Proceedings of SPIE)
Visual Information Processing XVI (Proceedings of SPIE)
Passive and Active Millimeter-Wave Imaging XVI (Proceedings of SPIE)
Infrared Spaceborne Remote Sensing and Instrumentation XV: 15 (Proceedings of SPIE)
Three-Dimensional Imaging, Interaction, and Measurement (Proceedings of SPIE)
Physics and Simulation of Optoelectronic Devices XIV (Proceedings of SPIE)
Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)
Novel Optical Systems Design and Optimization XVI (Proceedings of SPIE)
Optical Diagnostics and Sensing VII (Proceedings of SPIE)
XV International Symposium on Advanced Display Technologies (Proceedings of SPIE)
Endoscopic Microscopy (Proceedings of SPIE)
Optical Interactions with Tissue and Cells: XVI (Proceedings of SPIE)
Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)
