We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£115.00
Damage to VUV, EUV, and X-ray Optics (Proceedings of SPIE)
Price data last checked 66 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 14 days • 14 data points (No recent data available)
Price Distribution
Price distribution over 14 days • 1 price levels
Price Analysis
Most common price: £115 (14 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 14 days
Product Specifications
- Format
- paperback
- ASIN
- 0819467146
- Domain
- Amazon UK
- Release Date
- 15 July 2007
- Listed Since
- 12 January 2007
Barcode
No barcode data available
Similar Products You Might Like
Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)
Optomechatronic Actuators and Manipulation (Proceedings of SPIE)
Advanced Optics for Defense Applications: UV through LWIR II (Proceedings of SPIE)
Illumination Optics (Proceedings of SPIE)
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV (Proceedings of SPIE)
Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits (Proceedings of SPIE)
Confocal, Multiphoton and Nonlinear Microscopic Imaging (Proceedings of SPIE)
Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)
Ultrafast Nonlinear Imaging and Spectroscopy (Proceedings of SPIE)
Optomechatronic Micro/nano Devices and Components (Proceedings of SPIE)
Infrared and Photoelectronic Imagers and Detector Devices (Proceedings of SPIE)
Complex Light and Optical Forces (Proceedings of SPIE)
Optical Methods in the Life Sciences (Proceedings of SPIE)
Optomechatronic Systems Control (Proceedings of SPIE)
Adaptive Coded Aperture Imaging and Non-imaging Sensors (Proceedings of SPIE)
Optics and Photonics for Information Processing (Proceedings of SPIE)
Optical Molecular Probes for Biomedical Applications (Proceedings of SPIE)
Biophotonics and New Therapy Frontiers (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)
Optical Methods for Inspection, Characterization, and Imaging of Biomaterials (Proceedings of SPIE)
Nanophotonics and Macrophotonics for Space Environments (Proceedings of SPIE)