We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£115.00
Advances in X-ray/EUV Optics and Components III: 3 (Proceedings of SPIE)
Price data last checked 11 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 80 days · 80 data points (no recent data)
Price Distribution
Price distribution over 80 days • 1 price levels
Price Analysis
Most common price: £115 (80 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 80 days
Product Specifications
- Format
- paperback
- ASIN
- 0819472972
- Domain
- Amazon UK
- Release Date
- 28 August 2008
- Listed Since
- 03 March 2009
Barcode
No barcode data available
Similar Products You Might Like
Advances in X-ray/EUV Optics, Components and Applications (Proceedings of SPIE)
Fourth Generation X-ray Sources and Optics III (Proceedings of SPIE)
Advances in X-Ray/EUV Optics and Components VIII (Proceedings of SPIE)
Advances in X-Ray/Euv Optics and Components Vi
Optical Fabrication, Testing, and Metrology III: 3 (Proceedings of SPIE)
Advanced Materials and Devices for Sensing and Imaging III: 3 (Proceedings of SPIE)
Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)
Unconventional Imaging III: 3 (Proceedings of SPIE)
Optical Components and Materials III (Proceedings of SPIE)
Technologies for Optical Countermeasures III: 3 (Proceedings of SPIE)
Biophotonics and Immune Responses III (Proceedings of SPIE)
Advances in Optical Thin Films III (Proceedings of SPIE)
Optomechatronic Sensors and Instrumentation III: 3 (Proceedings of SPIE)
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X (Proceedings of SPIE)
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III: 3 (Proceedings of SPIE)
Confocal, Multiphoton, and Nonlinear Microscopic Imaging III (Proceedings of SPIE)
Optomechatronic Systems Control III: 3 (Proceedings of SPIE)
Photon Management III: 3 (Proceedings of SPIE)
Optomechatronic Actuators and Manipulation III: 3 (Proceedings of SPIE)
