Wiley Electromigration and Electronic Device Degradation

Nitride Semiconductor Technology: Power Electronics and Optoelectronic Devices

Wiley

ESD in Silicon Integrated Circuits

Wiley

ESD: Failure Mechanisms and Models

Wiley

Electronic Devices

Wiley

Wide Bandgap Semiconductors for Power Electronics: Materials, Devices, Applications

Wiley

Reliability and Failure of Electronic Materials and Devices

Academic Press

Electromigration in Metals: Fundamentals to Nano-Interconnects

Wiley Thermal Management Materials for Electronic Packaging

Wiley

Reliability and Failure of Electronic Materials and Devices

Academic Press

Wiley Electronic Materials Science - Advanced Science Textbook

Wiley

Wiley - Defects in Organic Semiconductors and Devices Book

Wiley

Managing Power Electronics: VLSI and DSP-Driven Systems

Wiley-IEEE Press

Defects in Microelectronic Materials and Devices

CRC Press

Reliability and Failure of Electronic Materials and Devices

Academic Press

Emerging Nanoelectronic Devices

Wiley

Devices for Integrated Circuits: Silicon and III-V Compound Semiconductors (Computer Engineering)

Wiley

Large Area and Flexible Electronics

Wiley

VLSI Fabrication Principles: Silicon and Gallium Arsenide

Wiley

ESD: Physics and Devices

Wiley

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy (Quality and Reliability Engineering)

Wiley

Principles & Technology of Modfets V 1 (Design And Measurement in Electronic Engineering)

Wiley-Blackwell

High-Speed Semiconductor Devices (Wiley-Interscience Publication)

Wiley

Graphene for Post-Moore Silicon Optoelectronics

Wiley

Semiconductor Devices: Physics and Technology

Wiley