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LAP Lambert Academic Publishing Zinc Oxide Thin-Film Transistors - Performance & Stability Study

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£51.99 £50.62 £50.92 £51.22 £51.52 £51.82 £52.12 22 July 2026 08 August 2026 25 August 2026 11 September 2026 29 September 2026
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Description

This comprehensive academic text examines zinc oxide thin-film transistors (TFTs) and their performance characteristics within semiconductor research. Zinc oxide, an n-type semiconductor material, demonstrates exceptional optical, electrical, catalytic and gas-sensing properties that make it valuable across multiple applications. The work focuses on TFT arrays fabricated through reactive radio frequency magnetron sputtering conducted at room temperature, providing detailed investigation into the role of high-k dielectrics in enhancing device stability and performance. Written by LAP Lambert Academic Publishing, this research-focused volume explores both fundamental properties and practical applications of transparent oxide semiconducting films in electronics engineering, offering insights into transparent semiconductor technology and its industrial potential.

Key Features

Explores zinc oxide thin-film transistor arrays prepared via reactive RF magnetron sputtering at room temperature.

Investigates performance and stability of zinc oxide-based transistors with emphasis on semiconductor behaviour.

Examines the role of high-k dielectrics in improving thin-film transistor device characteristics and longevity.

Covers zinc oxide's n-type semiconductor properties including optical, electrical, catalytic and gas-sensing capabilities.

Addresses applications of transparent oxide semiconducting films across electronics engineering and related fields.

Combines fundamental semiconductor science with practical electronics engineering applications and device development.

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