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£126.99
Wiley Spectroscopic Ellipsometry and Reflectometry User Guide
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Description
Key Features
Provides a practical introduction to spectroscopic ellipsometry and reflectometry techniques for thin film analysis.
Serves as a specialized guide for researchers and practitioners across multiple scientific disciplines.
Addresses wide-ranging applications in physics, chemistry, and materials science.
Supports professionals in electrical engineering and related technical fields.
Offers essential knowledge for measuring the thickness and optical properties of thin films.
Product Specifications
- Brand
- Wiley
- Format
- hardcover
- ASIN
- 0471181722
- Domain
- Amazon UK
- Release Date
- 06 April 1999
- Listed Since
- 19 February 2007
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