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Wiley Spectroscopic Ellipsometry and Reflectometry - User's Guide

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Description

Spectroscopic ellipsometry has emerged as the preferred technique for measuring thin film thickness and optical properties, offering significant advantages over traditional single wavelength methods. This practical guide by Wiley introduces both spectroscopic ellipsometry and reflectometry through real-world applications across physics, chemistry, electrical engineering, and materials science. Designed for practitioners and researchers working with thin films, the book bridges theory and hands-on implementation, making complex optical measurement techniques accessible to professionals seeking to master these essential characterisation methods. Whether you are optimising coatings, analysing semiconductor materials, or investigating optical properties of advanced materials, this comprehensive resource equips you with the knowledge and techniques needed for accurate spectroscopic analysis.

Key Features

Spectroscopic ellipsometry guide covers practical applications in physics, chemistry, electrical engineering, and materials science.

Introduction to reflectometry techniques as complementary method for optical property measurement and thin film analysis.

Authored by Wiley-Interscience, offering authoritative reference material for practitioners and research professionals.

Practical methodology for measuring thickness and optical properties of thin films using spectroscopic techniques.

Comprehensive resource suitable for multiple disciplines requiring thin film characterisation and optical analysis.

Product Specifications

Brand
Wiley
Format
hardcover
Domain
Amazon UK
Release Date
06 April 1999
Listed Since
19 February 2007

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No barcode data available

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