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Wiley Spectroscopic Ellipsometry and Reflectometry User Guide

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Description

Spectroscopic ellipsometry is rapidly becoming the preferred method for measuring the thickness and optical properties of thin films. While single wave ellipsometry is a long-standing technique, this book offers a practical introduction to the more advanced spectroscopic approach and its related reflectometry methods. Designed as a comprehensive guide for practitioners and researchers, this text provides the foundational knowledge needed to navigate these complex measurement techniques. It serves as a vital resource for professionals working across several scientific and technical fields, including physics, chemistry, electrical engineering, and materials science. Whether you are a student or an established researcher, this guide helps you understand the application of these methods in real-world scenarios to improve your thin film analysis and characterization processes.

Key Features

Provides a practical introduction to spectroscopic ellipsometry and reflectometry techniques for thin film analysis.

Serves as a specialized guide for researchers and practitioners across multiple scientific disciplines.

Addresses wide-ranging applications in physics, chemistry, and materials science.

Supports professionals in electrical engineering and related technical fields.

Offers essential knowledge for measuring the thickness and optical properties of thin films.

Product Specifications

Brand
Wiley
Format
hardcover
Domain
Amazon UK
Release Date
06 April 1999
Listed Since
19 February 2007

Barcode

No barcode data available

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