£165.66

Springer Wafer Scale Integration - Springer Technical Reference

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Description

Wafer Scale Integration by Springer is a comprehensive technical resource exploring the evolution of integrated circuit design beyond traditional VLSI methods. This book examines how WSI fabricates multiple circuit types on a single wafer, testing and interconnecting good cells to create complete systems without conventional packaging steps. By keeping signal lines on the wafer, WSI achieves lower stray capacitance and higher operating speeds compared to standard chip production. The text covers the fundamental differences between VLSI and WSI approaches, including wafer fabrication techniques, circuit testing methodology, and interconnection strategies. This used book in good condition provides engineers and designers with essential knowledge of wafer-scale manufacturing principles, making it an invaluable reference for anyone working with advanced semiconductor technology and system-on-wafer architecture.

Key Features

Wafer Scale Integration by Springer covers the complete fabrication and testing process for creating multi-cell systems directly on silicon wafers.

The book compares traditional VLSI dice-and-package methods with WSI approaches that interconnect good cells while keeping signal lines on the wafer.

Learn how low stray capacitance in Wafer Scale Integration systems enables high-speed operation without the overhead of conventional chip packaging.

This technical reference explores cell types, multiple instances, and interconnection strategies essential to understanding modern wafer-scale design.

Used book in good condition offers an affordable way to access Springer's authoritative treatment of integrated circuit fabrication technology.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
31 March 1989
Listed Since
16 February 2007

Barcode

No barcode data available

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