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Springer Soft Errors in Modern Electronic Systems - Vol 41

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Description

Soft Errors in Modern Electronic Systems: 41, part of the Frontiers in Electronic Testing series from Springer, offers a deep look into the research and technology used to understand and mitigate soft errors in advanced electronics. This volume covers the fundamental physical mechanisms behind radiation-induced soft errors and the various stages that lead to system failure. Readers gain insights into modeling and simulation across multiple levels, including physical, electrical, netlist, event-driven, RTL, and system-level approaches. The text also addresses hardware fault injection, accelerated radiation testing, and testing within natural environments. This book serves as a technical resource for those working on qualifying and managing soft error effects in contemporary electronic architectures.

Key Features

This Springer publication provides advanced research on understanding and mitigating soft error effects in modern electronics.

The text covers fundamental physical mechanisms related to radiation-induced soft errors and system failure steps.

Included is detailed information on modeling and simulation at physical, electrical, netlist, and RTL levels.

The book addresses hardware fault injection techniques and accelerated radiation testing methods.

Content includes guidance on performing testing within natural environments for electronic systems.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 September 2010
Listed Since
08 June 2010

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