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£80.00
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£80 today · cheaper than every other day in the last 3 months
Springer Scanning Electron Microscopy and X-Ray Microanalysis
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Most common price: £80 (27 days, 100.0%)
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Description
Key Features
This Springer publication provides a comprehensive introduction to scanning electron microscopy (SEM) techniques.
The text covers energy dispersive X-ray spectrometry (EDS) specifically for elemental microanalysis applications.
Learn about electron backscatter diffraction analysis (EBSD) for detailed micro-crystallography studies.
This updated Fourth Edition includes essential information on the use of focused ion beams.
The book serves as an authoritative scholarly resource for students, engineers, and technical managers.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 149396674X
- Domain
- Amazon UK
- Release Date
- 18 November 2017
- Listed Since
- 11 August 2016
Barcode
No barcode data available
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