We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£209.68
It has never been this cheap. We have no record of a lower price.
£210 today · cheaper than every other day in the last 3 months
Springer - Electron Backscatter Diffraction in Materials Science
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 23 days · 23 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 23 days • 1 price levels
Price Analysis
Most common price: £210 (23 days, 100.0%)
Price range: £210 - £210
Price levels: 1 different prices over 23 days
Description
Key Features
This Springer publication provides the fundamental basis for electron backscatter diffraction in materials science.
Learn to use diffraction techniques for determining crystallographic texture, grain boundary character distributions, and lattice strain.
The text covers the current state of both hardware and software used in electron backscatter diffraction.
Explore practical applications through illustrative examples involving undeformed and deformed metals and alloys.
Gain insights into applying these characterization methods to a wide range of materials including ceramics.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1489993347
- Domain
- Amazon UK
- Release Date
- 12 September 2014
- Listed Since
- 30 December 2014
Barcode
No barcode data available
Similar Products You Might Like
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Uniting Electron Crystallography and Powder Diffraction (NATO Science for Peace and Security Series B: Physics and Biophysics)
Springer
Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
Wiley
Microanalysis of Solids
Springer
Springer Diffraction Analysis of Microstructure of Materials 68
Springer
Structure from Diffraction Methods (Inorganic Materials Series)
Wiley
Local Structure from Diffraction (Fundamental Materials Research)
Springer
Local Structure from Diffraction (Fundamental Materials Research)
Springer
Uniting Electron Crystallography and Powder Diffraction (NATO Science for Peace and Security Series B: Physics and Biophysics)
Springer
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
Springer
Microstructural Characterization of Materials
Wiley
In-situ Materials Characterization: Across Spatial and Temporal Scales: 193 (Springer Series in Materials Science, 193)
Springer
CWP Publishing X-ray Absorption Fine Structure Analysis Book
CWP PUBLISHING
Basic Crystallography
Wiley
Price unavailable
Structure Analysis by Small-Angle X-Ray and Neutron Scattering
Springer