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£201.99
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Springer Lifetime Spectroscopy Silicon Defect Characterization
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Description
Key Features
This Springer publication provides a deep look into lifetime spectroscopy as a diagnostic tool for semiconductor impurity analysis.
The text focuses on the recombination process to identify defects that impact the performance of solar cells and semiconductor devices.
Readers can utilize the transparent modeling procedure included to perform detailed theoretical evaluations of spectroscopic techniques.
Theoretical predictions are supported by experimental verification through a comprehensive study of different materials.
Part of the Springer Series in Materials Science, volume 85, this book is tailored for photovoltaic application research.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642064531
- Domain
- Amazon UK
- Release Date
- 19 October 2010
- Listed Since
- 01 October 2010
Barcode
No barcode data available
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