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£121.67
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£122 today · previous high £122 · all-time low £121
Springer In-Situ Microscopy Materials Research - Electron & Scanning Probe
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Most common price: £121 (75 days, 100.0%)
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Description
Key Features
Covers high temperature UHV-STM systems and advanced in-situ microscopy techniques for materials research applications.
Includes detailed chapters on hydrogen desorption processes and phase transitions on silicon (111) surfaces.
Presents dynamic observation methods of superconducting vortices using electron waves and interference microscopy.
Features experimental Lorentz microscopy techniques and profile mode analysis for superconductor research.
Authored by leading international researchers in electron and scanning probe microscopy disciplines.
Comprehensive reference work published by Springer for analytical chemistry and materials science professionals.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1461378508
- Domain
- Amazon UK
- Publication Date
- 23 February 2014
- Listed Since
- 06 August 2014
Barcode
No barcode data available
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