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£108.00
Springer Beam Effects, Surface Topography, Depth Profiling - Surface Analysis
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Description
Key Features
Covers beam effects, surface topography, and depth profiling methods essential for comprehensive surface analysis and characterization work.
Authored by Springer, a leading academic publisher specialising in scientific and technical literature for researchers and professionals.
Volume 5 in the established Methods of Surface Characterization series, providing continuity with related volumes on surface analysis techniques.
Blends theoretical principles with practical laboratory guidance to help scientists analyse and interpret real sample data effectively.
Suitable for both novice researchers entering surface science and mature scientists seeking detailed reference material on advanced characterisation methods.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1441932992
- Domain
- Amazon UK
- Release Date
- 06 December 2010
- Listed Since
- 06 July 2010
Barcode
No barcode data available
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