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Oxford University Press - Introduction to Scanning Tunneling Microscopy

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Description

Master the fundamentals of nanotechnology with the third edition of Introduction to Scanning Tunneling Microscopy. Published by Oxford University Press, this volume serves as a standard reference and graduate-level textbook for nano-scientists. It covers the principles of the scanning tunneling microscope (STM), which was invented by Binnig and Rohrer and earned a Nobel Prize in Physics in 1986. This text explains how STM, alongside the atomic force microscope (AFM), provides non-destructive atomic and subatomic resolution on surfaces. Readers will learn how internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. As a cornerstone of the Monographs on the Physics and Chemistry of Materials series, this book is an essential resource for students and professionals studying advanced surface science and nanotechnology.

Key Features

This third edition from Oxford University Press serves as a graduate-level textbook for training new generations of nano-scientists.

The text covers the scanning tunneling microscope (STM) technology that earned the Nobel Prize of Physics in 1986.

Learn how STM and atomic force microscopy (AFM) provide non-destructive atomic and subatomic resolution on various surfaces.

Study methods for observing and mapping the internal details of atomic and molecular wavefunctions with negligible disturbance.

This volume is part of the recognized Monographs on the Physics and Chemistry of Materials series.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 March 2021
Listed Since
15 July 2020

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