We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£133.93
This is the usual price. Wait for it to drop, or tell us your number.
£134 today · usual range £124–£139 · best ever £124
Elsevier Ion Implantation into Semiconductors, Oxides and Ceramics - Volume 85
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 90 days · 90 data points
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 90 days • 4 price levels
Price Analysis
Most common price: £126 (55 days, 61.1%)
Price range: £124 - £139
Price levels: 4 different prices over 90 days
Description
Key Features
Volume 85 in the European Materials Research Society Symposia Proceedings series documents ion implantation research across semiconductors, oxides and ceramics.
Contains peer-reviewed papers from 110 contributions submitted by leading researchers from 31 nations across 5 continents.
Published by Elsevier Science, this proceedings volume captures the state of ion beam techniques and applications in materials engineering.
Represents the largest symposium in the E-MRS ion beam series, demonstrating the critical role of ion implantation in modern materials science.
Product Specifications
- Brand
- Elsevier
- Model
- index
- Format
- hardcover
- ASIN
- 0080436137
- Domain
- Amazon UK
- Release Date
- 05 March 1999
- Listed Since
- 06 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Ion Implantation: Basics to Device Fabrication: 293 (The Springer International Series in Engineering and Computer Science, 293)
Springer
Ion-Solid Interactions: Fundamentals and Applications (Cambridge Solid State Science)
Cambridge University Press
Ion Implantation: Basics to Device Fabrication: 293 (The Springer International Series in Engineering and Computer Science, 293)
Springer
Ion-Solid Interactions: Fundamentals and Applications (Cambridge Solid State Science Series)
Cambridge University Press
Ion Beam Modification of Solids: Ion-Solid Interaction and Radiation Damage: 61 (Springer Series in Surface Sciences, 61)
Springer
Swift Heavy Ions for Materials Engineering and Nanostructuring: 145 (Springer Series in Materials Science, 145)
Springer
Ionenimplantation
Vieweg+Teubner Verlag
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
Ionization of Solids by Heavy Particles: Proceedings of a NATO ARW Held in Taormina, Italy, June 1-5, 1992: v. 306 (NATO Science Series B: Physics)
Springer
Fundamentals of Ion-Irradiated Polymers - Springer Series 63
Springer
Swift Ion Beam Analysis in Nanosciences (Iste)
Wiley
Patterns, Defects and Microstructures in Nonequilibrium Systems: Applications in Materials Science: 121 (NATO Science Series E:, 121)
Springer
Inelastic Particle-Surface Collisions: Proceedings of the Third International Workshop on Inelastic Ion-Surface Collisions Feldkirchen-Westerham, Fed. ... (Springer Series in Chemical Physics, 17)
Springer
Ion Beam Analysis: Fundamentals and Applications
CRC Press
Solid State Ionics: Ionics For Sustainable World - Proceedings Of The 13th Asian Conference
World Scientific Publishing Company
Ion Implantation in Microelectronics: A Comprehensive Bibliography (Computer Science Information Guides)
Springer
Ion Beam Modification of Solids: Ion-Solid Interaction and Radiation Damage: 61 (Springer Series in Surface Sciences, 61)
Springer
Atomic Physics of Highly Charged Ions: Proceedings of the Fifth International Conference on the Physics of Highly Charged Ions ... Republic of Germany, 10–14 September 1990
Springer
Ion Sources
Springer
Nanofabrication by Ion-Beam Sputtering: Fundamentals and Applications
Taylor & Francis
The Use of Ion Implantation for Biomedical Applications: Implantation of B, C and Zr ions into ceramic and metallic alloys were studied for potential biomedical applications
LAP Lambert Academic Publishing
Cluster Ion-Solid Interactions: Theory, Simulation, and Experiment
CRC Press