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CRC Press Soft Errors: From Particles to Circuits - CRC Press

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Description

Soft Errors: From Particles to Circuits is a comprehensive technical resource exploring how natural radiation affects digital integrated circuits in real-world environments. This book bridges applied physics and engineering sciences, addressing the multiscale and multiphysics nature of soft errors in modern electronics. It combines insights from nuclear physics, semiconductor design, materials science, circuit engineering, and cosmic-ray physics to provide engineers and researchers with a complete understanding of soft error mechanisms. Whether you work in chip design, reliability engineering, or radiation physics, this detailed volume equips you with the knowledge needed to identify, analyse, and mitigate soft errors in terrestrial applications. Part of the Devices, Circuits, and Systems series, it serves as both a technical reference and a foundational text for anyone involved in designing radiation-hardened circuits or improving electronic reliability.

Key Features

Soft Errors: From Particles to Circuits integrates nuclear physics, semiconductor physics, and circuit design perspectives into one comprehensive reference.

Covers terrestrial natural radiation effects on digital integrated circuits, addressing real-world reliability challenges in modern electronics.

Combines multiscale and multiphysics approaches spanning cosmic-ray physics, particle detection, material sciences, and chip architecture.

Published by CRC Press as part of the Devices, Circuits, and Systems series, providing authoritative technical content for engineers and researchers.

Suitable for circuit designers, reliability engineers, and physicists seeking deep knowledge of soft error mechanisms and mitigation strategies.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
25 February 2015
Listed Since
03 December 2012

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No barcode data available

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