Wiley Terrestrial Radiation Effects in ULSI Devices Book

Understand the complex relationship between radiation fields and electronic systems with this technical guide from Wiley-IEEE Press. This book provides essential knowledge regarding how various radiation types impact ULSI devices and larger electronic systems. Readers explore the specific faults and failures caused by electrons, alpha-rays, muons, gamma rays, neutrons, and heavy ions. By bridging the gap between physical insights and mathematical application, the text teaches you how to develop numerical models to analyze these radiation effects effectively. Whether you are looking to improve system reliability or study device vulnerabilities, this resource covers a wide range of prediction, detection, characterization, and mitigation techniques against soft-errors. It is a comprehensive tool for engineers and scientists working with advanced electronic technologies in environments exposed to terrestrial radiation.