£114.00

Wiley Terrestrial Radiation Effects in ULSI Devices Book

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Description

Understand the complex relationship between radiation fields and electronic systems with this technical guide from Wiley-IEEE Press. This book provides essential knowledge regarding how various radiation types impact ULSI devices and larger electronic systems. Readers explore the specific faults and failures caused by electrons, alpha-rays, muons, gamma rays, neutrons, and heavy ions. By bridging the gap between physical insights and mathematical application, the text teaches you how to develop numerical models to analyze these radiation effects effectively. Whether you are looking to improve system reliability or study device vulnerabilities, this resource covers a wide range of prediction, detection, characterization, and mitigation techniques against soft-errors. It is a comprehensive tool for engineers and scientists working with advanced electronic technologies in environments exposed to terrestrial radiation.

Key Features

Covers a wide variety of radiation fields including electrons, alpha-rays, muons, gamma rays, neutrons, and heavy ions.

Provides guidance on how to build numerical models based on physical insights for better analysis.

Explains different mathematical approaches required to study and analyze radiation-induced effects.

Includes various techniques for the prediction and detection of soft-errors in electronic systems.

Offers methods for the characterization and mitigation of radiation effects in ULSI devices.

Product Specifications

Brand
Wiley
Format
hardcover
Domain
Amazon UK
Release Date
13 February 2015
Listed Since
08 February 2013

Barcode

No barcode data available

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