We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£988.98
It has never been this cheap. We have no record of a lower price.
£989 today · cheaper than every other day in the last 3 months
CRC Press Microprobe Characterization of Optoelectronic Materials
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 86 days · 86 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 86 days • 1 price levels
Price Analysis
Most common price: £989 (86 days, 100.0%)
Price range: £989 - £989
Price levels: 1 different prices over 86 days
Description
Key Features
Expertly written chapters by leading specialists in various microprobe techniques.
Provides detailed information on small structures including quantum dots and quantum lines.
Analyzes microscopic defects, strain, and layer composition in optoelectronic materials.
Covers multiple probe types such as electrons, photons, and tips.
Explores different microscopy methods including optical, electron, and tunneling.
Serves as a diagnostic technique for studying device degradation.
Designed for post-graduate researchers and crystal growth professionals.
Product Specifications
- Brand
- CRC Press
- Colour
- Multicolor
- Format
- hardcover
- ASIN
- 1560329416
- Domain
- Amazon UK
- Release Date
- 15 November 2002
- Listed Since
- 10 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Springer Optical Spectroscopy of Low Dimensional Semiconductors
Springer
Optical Properties of Semiconductor Nanostructures: 81 (NATO Science Partnership Subseries: 3, 81)
Springer
Electronic Quantum Transport in Mesoscopic Semiconductor Structures: 192 (Springer Tracts in Modern Physics, 192)
Springer
Springer Recent Trends in Materials Science Proceedings 189
Springer
Light Emitting Silicon for Microphotonics: 194 (Springer Tracts in Modern Physics, 194)
Springer
Springer Recent Trends in Materials Science Proceedings 189
Springer
Nano-Optoelectronics: Concepts, Physics and Devices - Springer
Springer
Electrically Driven Quantum Dot Based Single-Photon Sources: Modeling and Simulation (Springer Theses)
Springer
Quantum Dot Photodetectors: 30 (Lecture Notes in Nanoscale Science and Technology, 30)
Springer
Optical Properties of Materials and Their Applications (Wiley Series in Materials for Electronic & Optoelectronic Applications)
Wiley
CRC Press Physics of Semiconductors and Nanostructures Book
CRC Press
Optical Switching in Low-Dimensional Systems: 194 (NATO Science Series B:, 194)
Springer
Springer Frontiers in Nanoscale Science of Micron Devices 328
Springer
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164
CRC Press
Photoactive Semiconductor Nanocrystal Quantum Dots: Fundamentals and Applications (Topics in Current Chemistry Collections)
Springer
Quantum Wells, Wires and Dots: Theoretical and Computational Physics of Semiconductor Nanostructures, 4th Edition
Wiley
Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications
Elsevier
Advanced Optical Spectroscopy Techniques for Semiconductors: Raman, Infrared, and Cathodoluminescence Spectroscopy
Springer
Quantum Dot Optoelectronic Devices: 27 (Lecture Notes in Nanoscale Science and Technology, 27)
Springer
Inelastic Light Scattering Semiconductor Nanostructures Book
Springer
Tuning Semiconducting and Metallic Quantum Dots: Spectroscopy and Dynamics
Taylor & Francis
High-Performance Carbon-Based Optoelectronic Nanodevices: 319 (Springer Series in Materials Science, 319)
Springer
Light Emitting Silicon for Microphotonics: 194 (Springer Tracts in Modern Physics, 194)
Springer
Microscopy of Semiconducting Materials 1987 - Conference Proceedings
CRC Press