£160.00

CRC Press - Measurement and Modeling of Silicon Heterostructure

Name: CRC Press - Measurement and Modeling of Silicon Heterostructure
Brand: CRC Press
Price: 159.99 GBP
Availability: InStock

Electrical Engineering

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Description

Master the specialized techniques required for high-speed semiconductor analysis with Measurement and Modeling of Silicon Heterostructure Devices. Published by CRC Press, this technical resource addresses a significant gap in current scientific literature regarding the practical application of laboratory methods. Many researchers struggle to replicate high-quality data sets because the specific methods used to obtain them are rarely documented. This book provides the necessary guidance for professionals working with modern SiGe devices. It focuses on the dexterity required in the laboratory to secure reliable data and the modeling skills needed to interpret complex results. By studying these measurement and modeling practices, engineers and scientists can move beyond wondering how professional data is presented and begin implementing these industry-standard methods themselves. This text is a practical guide for anyone looking to improve their proficiency in semiconductor device measurement and modeling.

Key Features

Learn the practical tricks of the trade for obtaining high-quality semiconductor data sets.

Gain technical insights into the measurement and modeling of high-speed semiconductor devices.

Develop the laboratory dexterity required to achieve reliable results with modern SiGe devices.

Bridge the gap between theoretical knowledge and practical laboratory application in semiconductor engineering.

Access professional methods for modeling performance at the levels found in modern silicon heterostructure technology.

Product Specifications

Brand: CRC Press
Format: Hardcover
ASIN: 1420066927
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Electrical Engineering
Domain: Amazon UK
Release Date: 13 December 2007
Listed Since: 22 June 2007

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CRC Press - Measurement and Modeling of Silicon Heterostructure

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