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£160.37
CRC Press - Measurement and Modeling of Silicon Heterostructure
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Description
Key Features
Learn the practical tricks of the trade for obtaining high-quality semiconductor data sets.
Gain technical insights into the measurement and modeling of high-speed semiconductor devices.
Develop the laboratory dexterity required to achieve reliable results with modern SiGe devices.
Bridge the gap between theoretical knowledge and practical laboratory application in semiconductor engineering.
Access professional methods for modeling performance at the levels found in modern silicon heterostructure technology.
Product Specifications
- Brand
- CRC Press
- Format
- hardcover
- ASIN
- 1420066927
- Domain
- Amazon UK
- Release Date
- 13 December 2007
- Listed Since
- 22 June 2007
Barcode
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