Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems) - Image 1

£101.00

World Scientific Publishing Company Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems)

Name: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems)
Brand: World Scientific Publishing Company
Price: 102.35 GBP
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Description

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Product Specifications

Brand: World Scientific Publishing Company
Format: hardcover
ASIN: 9812389407
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical
Domain: Amazon UK
Release Date: 29 July 2004
Listed Since: 13 December 2006

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World Scientific Publishing Company Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 (Selected Topics in Electronics and Systems)

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