Scattering Effects in SiNW Transistors: A Future Device Modelling - Image 1

£61.00

LAP Lambert Academic Publishing Scattering Effects in SiNW Transistors: A Future Device Modelling

Name: Scattering Effects in SiNW Transistors: A Future Device Modelling
Brand: LAP Lambert Academic Publishing
Price: 61.0 GBP
Availability: InStock

Electronics Engineering

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Description

This book "ANALYSIS OF CERTAIN SCATTERING EFFECTS IN SI NANOWIRE TRANSISTORS" derives the analytical drain current models for certain Scattered Silicon Nanowire MOSFET. Scattered Silicon Nanowire MOSFET is revealed which includes the effects of elastic scattering, optical phonon emission, surface roughness scattering, Discrete Random dopants and Temperature effects. These analytical models are validated by comparing their results with TCAD simulations.

Product Specifications

Brand: LAP Lambert Academic Publishing
Format: paperback
ASIN: 6200483582
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering
Domain: Amazon UK
Release Date: 15 December 2019
Listed Since: 02 March 2020

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LAP Lambert Academic Publishing Scattering Effects in SiNW Transistors: A Future Device Modelling

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