Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs - Image 1

£66.00

LAP Lambert Academic Publishing Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs

Name: Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs
Brand: LAP Lambert Academic Publishing
Price: 66.0 GBP
Availability: InStock

Electronics Engineering

Price data last checked 11 day(s) ago - will refresh soon

View at Amazon

We'll watch every seller, every day. One email when your price arrives.

It has never been this cheap. We have no record of a lower price.

£66 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 80 days • 80 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 80 days • 1 price levels

Days at Price

Price Analysis

Most common price: £66 (80 days, 100.0%)

Price range: £66 - £66

Price levels: 1 different prices over 80 days

Product Specifications

Brand: LAP Lambert Academic Publishing
Format: paperback
ASIN: 383836404X
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering
Domain: Amazon UK
Release Date: 22 June 2010
Listed Since: 29 June 2010

Barcode

No barcode data available

LAP Lambert Academic Publishing Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs

It has never been this cheap. We have no record of a lower price.

Price History & Forecast

Price Distribution

Price Analysis

Product Specifications

Barcode

Similar Products You Might Like

Dynamic Modeling of Arc Discharge on Ice-covered Insulators: Performance of High Voltage Insulators in Cold Environments

Фотогальванические эффекты в полупроводниках

Self-Biased Polychrystalline Ferrites for Microwave Applications: An Evaluation of Common Techniques and Recommendations for Fabrication of Thick C-axis Oriented Ferrite Films

Electronic Materials: Introduction, Processing, Characterization and Applications

Microstructure, Stress and Defect Evolution: Under Illumination in Hydrogenated Amorphous Silicon (a-Si:H)

Mechanical properties of microstructural components of inorg materials

Stabilizatsiya nanochastits metallov gidrofil'nymi polimerami

Magnetic Semiconducting Clusters: A First principle investigation: Structural, Electronic and Magnetic Properties of Doped Semiconductor Clusters

Investigations on Magnetron Sputtered Titanium based Oxide Films: For Microelectronic Devices

MICROWAVE SINTERING OF METALS: MODELING OF MICROWAVE HEATING OF PARTICULATE METALS AND ITS APPLICATION IN SINTERING OF TUNGSTEN-BASED ALLOYS

Crystallographic modeling & electrical behavior of industrial ceramics: Structure and electrical behavior of some industrially important ceramic materials

Retsikling metallurgicheskikh shlakov v tekhnologii litsevogo kirpicha: Tekhnologicheskie resheniya

Conductive photopolymers: Insitu synthesis of metal nanoparticles

Preparation of Superionic Conductors by Solid State Reactions: Studies on Composite Ion Conductors

High Temperature Corrosion and Erosion: Nanostructured and Conventional Coatings

Inorganic Nanomaterials: Synthesis, Characterization and Applications

IMPACTS OF EMERGING TECHNOLOGIES FROM A LIFE CYCLE PERSPECTIVE: LIFE CYCLE IMPLICATIONS OF QUANTUM DOT SEMICONDUCTOR MATERIALS

Performance Evaluation of Thermoelectric Modules: An Analytical Approach using Effective Material Properties

Time Domain Modelling Issues: Special reference to Dispersive and Nonlinear Materials for Optoelectronics using TLM

Magnetic Interactions in Metal Organic Framework Compounds

Teoriya i metodika elektromagnitnykh zondirovaniy: s moshchnymi kontroliruemymi istochnikami

Electrical, Magnetic and Mössbauer properties of Mg-Cd Ferrites: Properties of Ferrites

Komp'yuternoe modelirovanie asinkhronnykh dvigateley i transformatorov: Primery vzaimodeystviya s silovymi elektronnymi preobrazovatelyami

Эмиссионная мессбауэровская спектроскопия: Пространственное распределение электронных дефектов в высокотемпературных сверхпроводниках: ... w wysokotemperaturnyh swerhprowodnikah