We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£107.78
Springer Strain-Induced Effects in Advanced MOSFETs: 0 (Computational Microelectronics)
Price data checked 1 day ago
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 3 months ago.
£108 today · all-time low £107 (Feb 2026) · usually £108
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 90 days • 90 data points
Price Distribution
Price distribution over 90 days • 2 price levels
Price Analysis
Most common price: £107 (82 days, 91.1%)
Price range: £107 - £108
Price levels: 2 different prices over 90 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3709119332
- Domain
- Amazon UK
- Release Date
- 23 August 2016
- Listed Since
- 22 June 2016
Barcode
No barcode data available
Similar Products You Might Like
Nanoscale Transistors: Device Physics, Modeling and Simulation
Springer
Fundamentals of III-V Semiconductor MOSFETs
Springer
The Monte Carlo Method for Semiconductor Device Simulation (Computational Microelectronics)
Springer
Transistor Level Modeling for Analog/RF IC Design
Springer
Characterization Methods for Submicron MOSFETs: 352 (The Springer International Series in Engineering and Computer Science, 352)
Springer
Advanced Physical Models for Silicon Device Simulation (Computational Microelectronics)
Springer
Charge Transport in Low Dimensional Semiconductor Structures: The Maximum Entropy Approach: 31 (Mathematics in Industry, 31)
Springer
High Permittivity Gate Dielectric Materials: 43 (Springer Series in Advanced Microelectronics, 43)
Springer
Physics of Submicron Devices (Microdevices: Physics & Fabrication Technologies)
Springer
Semiconductor Device Modelling
Springer
Physics of High-Speed Transistors (Microdevices)
Springer
Deterministic Solvers for the Boltzmann Transport Equation (Computational Microelectronics)
Springer
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling: 52 (Springer Series in Advanced Microelectronics, 52)
Springer
Atomistic and Continuum Modeling of Nanocrystalline Materials: Deformation Mechanisms and Scale Transition: 112 (Springer Series in Materials Science, 112)
Springer
Device and Circuit Cryogenic Operation for Low Temperature Electronics
Springer
Graphene Nanoelectronics: From Materials to Circuits
Springer
Nanostructures: Theory and Modeling (NanoScience and Technology)
Springer
Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond (Springer Theses)
Springer
Electrical Atomic Force Microscopy for Nanoelectronics (NanoScience and Technology)
Springer
Computational Electronics: Semiconductor Transport and Device Simulation: 113 (The Springer International Series in Engineering and Computer Science, 113)
Springer
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science, 270)
Springer
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Springer
Modeling of AlGaN/GaN High Electron Mobility Transistors (Springer Tracts in Electrical and Electronics Engineering)
Springer
Noise in Nanoscale Semiconductor Devices
Springer