We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£109.07
Springer Characterization Methods for Submicron MOSFETs: 352 (The Springer International Series in Engineering and Computer Science, 352)
Price data last checked 13 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 3 months ago.
£109 today · all-time low £107 (May 2026) · usually £109
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 78 days · 78 data points (no recent data)
Price Distribution
Price distribution over 78 days • 5 price levels
Price Analysis
Most common price: £108 (44 days, 56.4%)
Price range: £107 - £112
Price levels: 5 different prices over 78 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1461285844
- Domain
- Amazon UK
- Publication Date
- 26 September 2011
- Listed Since
- 21 December 2012
Barcode
No barcode data available
Similar Products You Might Like
Nanoscale Transistors: Device Physics, Modeling and Simulation
Springer
Fundamentals of III-V Semiconductor MOSFETs
Springer
Noise in Semiconductor Devices: Modeling and Simulation: 7 (Springer Series in Advanced Microelectronics, 7)
Springer
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling: 52 (Springer Series in Advanced Microelectronics, 52)
Springer
Transistor Level Modeling for Analog/RF IC Design
Springer
Strain-Induced Effects in Advanced MOSFETs: 0 (Computational Microelectronics)
Springer
An Introduction to Contact Resistance
Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability: 157 (Springer Series in Materials Science, 157)
Springer
Semiconductor Device Modelling
Springer
Device and Circuit Cryogenic Operation for Low Temperature Electronics
Springer
Testing and Reliable Design of CMOS Circuits: 88 (The Springer International Series in Engineering and Computer Science, 88)
Springer
Physics of High-Speed Transistors (Microdevices)
Springer
Advanced Gate Stacks for High-Mobility Semiconductors: 27 (Springer Series in Advanced Microelectronics, 27)
Springer
Theory and Practice of Thermal Transient Testing of Electronic Components
Springer
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science, 270)
Springer
Polycrystalline Silicon for Integrated Circuit Applications: 45 (The Springer International Series in Engineering and Computer Science, 45)
Springer
High Permittivity Gate Dielectric Materials: 43 (Springer Series in Advanced Microelectronics, 43)
Springer
Physics of Submicron Devices (Microdevices: Physics & Fabrication Technologies)
Springer
The Materials Science of Semiconductors
Springer
Methodology for the Modeling and Simulation of Microsystems: 2
Springer
CMOS Memory Circuits
Springer
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing, 34)
Springer
Graphene Nanoelectronics: From Materials to Circuits
Springer
Microelectronic Test Structures for CMOS Technology
Springer