Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 9 (Springer Series in Chemical Physics, 9) - Image 1

£76.25

Springer Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 9 (Springer Series in Chemical Physics, 9)

Name: Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 9 (Springer Series in Chemical Physics, 9)
Brand: Springer
Price: 76.25 GBP
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Photography & Video

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Description

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 3642618731
Category: Books > Subjects > Arts & Photography > Photography & Video
Domain: Amazon UK
Release Date: 13 December 2011
Listed Since: 12 July 2012

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