£160.99

New Trends and Potentialities of Tof-sims in Surface Studies

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Description

This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.

Key Features

New

Mint Condition

Dispatch same day for order received before 12 noon

Guaranteed packaging

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Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
15 September 2007
Listed Since
16 February 2007

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