£160.99

New Trends and Potentialities of Tof-sims in Surface Studies

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Description

This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.

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Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
15 September 2007
Listed Since
16 February 2007

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