£125.98

It has never been this cheap. We have no record of a lower price.

£126 today · cheaper than every other day in the last 3 months

Morgan & Claypool ToF-SIMS and Materials Science Book

View at Amazon

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 28 days · 28 data points (no recent data)

Historical
Generating forecast…
£125.98 £119.68 £122.20 £124.72 £127.24 £129.76 £132.28 28 July 2026 03 August 2026 10 August 2026 17 August 2026 24 August 2026
View at Amazon ↗

Price data last checked 63 day(s) ago - refreshing...

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↑ Price chart
when this has been cheap or pricey
↑ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price Distribution

Price distribution over 28 days • 1 price levels

Days at Price
28 days 0 7 14 21 28 £126 Days at Price

Price Analysis

Most common price: £126 (28 days, 100.0%)

Price range: £126 - £126

Price levels: 1 different prices over 28 days

Description

Explore the fundamentals and practical uses of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) with this specialized text from Morgan & Claypool. Part of the IOP Concise Physics series, this book provides a clear overview of SIMS principles and their role in high-resolution surface analysis. Readers will learn how dual-beam ToF-SIMS is applied to investigate various materials systems and properties. The content tracks the evolution of SIMS instrumentation, moving from early models dedicated to depth profiling with high-ion-beam currents to modern capabilities used for advanced characterization in materials science. This resource is designed for those needing to understand how modern mass spectrometry techniques facilitate detailed surface investigations.

Key Features

This Morgan & Claypool publication covers the principles of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS).

The text provides specific examples of how dual-beam ToF-SIMS is used to investigate materials systems and properties.

Learn about high-resolution surface analysis and characterization techniques for various materials.

The book explains the historical development of SIMS instrumentation from early depth profiling tools to current technology.

This volume is part of the IOP Concise Physics series focused on materials science applications.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 October 2015
Listed Since
18 August 2021

Barcode

No barcode data available

Similar Products You Might Like

Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications: Volume 16 (New Developments in Mass Spectrometry)
95% match

Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications: Volume 16 (New Developments in Mass Spectrometry)

Royal Society of Chemistry

£165.70 21 Aug 2026
Atom Probe Tomography: Analysis at the Atomic Level
95% match

Atom Probe Tomography: Analysis at the Atomic Level

Springer

£113.93 22 Aug 2026
Differential Ion Mobility Spectrometry: Nonlinear Ion Transport and Fundamentals of FAIMS
95% match

Differential Ion Mobility Spectrometry: Nonlinear Ion Transport and Fundamentals of FAIMS

CRC Press

£50.99 21 Oct 2026
Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley Series on Mass Spectrometry)
95% match

Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley Series on Mass Spectrometry)

Wiley

£88.12 22 Sep 2026
Solid Sample Analysis: Direct and Slurry Sampling using GF-AAS and ETV-ICP
95% match

Solid Sample Analysis: Direct and Slurry Sampling using GF-AAS and ETV-ICP

Springer

£193.15 12 Sep 2026
Ion Mobility Spectrometry, Third Edition
95% match

Ion Mobility Spectrometry, Third Edition

CRC Press

£65.99 02 Oct 2026
Introduction to Focused Ion Beam Nanometrology (IOP Concise Physics)
95% match

Introduction to Focused Ion Beam Nanometrology (IOP Concise Physics)

Morgan & Claypool

£118.98 02 Oct 2026
CRC Press ICP-MS and Atomic Spectroscopy Tutorial Guide
95% match

CRC Press ICP-MS and Atomic Spectroscopy Tutorial Guide

CRC Press

£152.33 17 Sep 2026
Practical Aspects of Trapped Ion Mass Spectrometry, Volume IV: Theory and Instrumentation
95% match

Practical Aspects of Trapped Ion Mass Spectrometry, Volume IV: Theory and Instrumentation

CRC Press

£77.00 19 Sep 2026
Practical Aspects of Trapped Ion Mass Spectrometry, Volume IV: Theory and Instrumentation: 4
95% match

Practical Aspects of Trapped Ion Mass Spectrometry, Volume IV: Theory and Instrumentation: 4

CRC Press

£205.64 22 Aug 2026
ISIAME 2012: Mossbauer Effect Industrial Applications Proceedings
95% match

ISIAME 2012: Mossbauer Effect Industrial Applications Proceedings

Springer

£141.98 29 Sep 2026
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
94% match

Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems

£123.99 30 Sep 2026
Inorganic Mass Spectrometry: Principles and Applications
94% match

Inorganic Mass Spectrometry: Principles and Applications

Wiley

£156.49 03 Oct 2026
Lasers in Analytical Atomic Spectroscopy
94% match

Lasers in Analytical Atomic Spectroscopy

Wiley

£320.95 26 Aug 2026
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
94% match

High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Springer

£193.00 19 Sep 2026
Principles of Analytical Electron Microscopy
94% match

Principles of Analytical Electron Microscopy

Springer

£121.58 30 Sep 2026
Electron Microprobe Analysis: Second Edition
94% match

Electron Microprobe Analysis: Second Edition

Cambridge University Press

£56.00 24 Sep 2026
Practical Aspects of Ion Trap Mass Spectrometry, Volume I: Fundamentals of Ion Trap Mass Spectrometry: 001 (Modern Mass Spectrometry)
94% match

Practical Aspects of Ion Trap Mass Spectrometry, Volume I: Fundamentals of Ion Trap Mass Spectrometry: 001 (Modern Mass Spectrometry)

CRC Press

£94.86 19 Sep 2026
Mass Spectrometry of Inorganic and Organometallic Compounds: Tools - Techniques - Tips (Inorganic Chemistry: A Textbook Series)
94% match

Mass Spectrometry of Inorganic and Organometallic Compounds: Tools - Techniques - Tips (Inorganic Chemistry: A Textbook Series)

Wiley

£57.94 30 Sep 2026
Solid Sample Analysis: Direct and Slurry Sampling using GF-AAS and ETV-ICP
94% match

Solid Sample Analysis: Direct and Slurry Sampling using GF-AAS and ETV-ICP

Springer

£144.01 11 Sep 2026