Springer Quantum Metrology, Imaging, and Communication (Quantum Science and Technology)

Product Description This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography. From the Back Cover This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography. About the Author David Simon. Professor, Stonehill College, Easton MA 02357, USA  Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA