Springer Knowledge-Driven Board-Level Functional Fault Diagnosis

Product Description This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing; • Demonstrates techniques based on industrial data and feedback from an actual manufacturing line; • Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. From the Back Cover This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing; • Demonstrates techniques based on industrial data and feedback from an actual manufacturing line; • Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. About the Author Fangming Ye is a Staff Engineer at Huawei Technologies, with particular research interests in machine learning, data mining, resilient system design, and diagnosis system for board-level faults. Zhaobo Zhang is a Staff Engineer at Huawei Technologies, specializing in Data analysis and machine learning, Network reliability, Application design, Flow standardization, diagnosis automation, and memory test. Krishnendu Chakrabarty is the William H. Younger Distinguished Professor of Engineerin