Materials and Contact Characterisation X: 133 (WIT Transactions on Engineering Sciences)

Boundary Elements and Other Mesh Reduction Methods XLVI: 135 (WIT Transactions on Engineering Sciences)

Boundary Elements and other Mesh Reduction Methods XLIV: 131 (WIT Transactions on Engineering Sciences)

Boundary Elements and other Mesh Reduction Methods XLV: 134 (WIT Transactions on Engineering Sciences)

Imaging Spectrometry XIII: 13 (Proceedings of SPIE)

Risk Analysis, Hazard Mitigation and Safety and Security Engineering XIII: 214 (WIT Transactions on The Built Environment)

Optoelectronic Integrated Circuits X: 10 (Proceedings of SPIE)

Optical Fibers and Sensors for Medical Diagnostics and Treatment Applications X (Proceedings of SPIE)

Sensors for Harsh Environments III: 3 (Proceedings of SPIE)

Air Pollution XXIX: 252 (WIT Transactions on Ecology and the Environment)

Advances in Resist Materials and Processing Technology XXV (Proceedings of SPIE)

Advanced Microscopy Techniques III (Proceedings of SPIE)

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Emerging Liquid Crystal Technologies III: 3 (Proceedings of SPIE)

Infrared Technology and Applications XXXIII (Proceedings of SPIE)

Ophthalmic Technologies XVIII: 18 (Proceedings of SPIE)

Optomechatronic Micro/nano Devices and Components III (Proceedings of SPIE)

Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)

Selected Papers on Optical Interconnects and Packaging (SPIE milestone series): v. MS 142

Technologies for Optical Countermeasures III: 3 (Proceedings of SPIE)

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XV International Symposium on Advanced Display Technologies (Proceedings of SPIE)

Passive Millimeter-wave Imaging Technology X (Proceedings of SPIE)

Ultrafast Phenomena in Semiconductors and Nanostructure Materials X (Proceedings of SPIE)

Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)