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CRC Press Microprobe Characterization of Optoelectronic Materials: 17 (Optoelectronic Properties of Semiconductors and Superlattice)

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Description

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Product Specifications

Colour
Multicolor
Format
hardcover
Domain
Amazon UK
Release Date
15 November 2002
Listed Since
10 February 2007

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