Microprobe Characterization of Optoelectronic Materials: 17 (Optoelectronic Properties of Semiconductors and Superlattice) - Image 1

Price loading...

CRC Press Microprobe Characterization of Optoelectronic Materials: 17 (Optoelectronic Properties of Semiconductors and Superlattice)

Name: Microprobe Characterization of Optoelectronic Materials: 17 (Optoelectronic Properties of Semiconductors and Superlattice)
Brand: CRC Press

Multicolor

Electrical Engineering

Price History & Forecast

No Price Data Available

Price history will appear here once data is collected from Amazon.

Price Distribution

No price data available for histogram

Description

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Product Specifications

Brand: CRC Press
Colour: Multicolor
Format: hardcover
ASIN: 1560329416
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Electrical Engineering
Domain: Amazon UK
Release Date: 15 November 2002
Listed Since: 10 February 2007

Barcode

No barcode data available

CRC Press Microprobe Characterization of Optoelectronic Materials: 17 (Optoelectronic Properties of Semiconductors and Superlattice)

Price History & Forecast

No Price Data Available

Price Distribution

Description

Product Specifications

Barcode

Similar Products You Might Like

CRC Press - Optical Techniques for Solid-State Materials

Semiconductor Nanocrystals and Metal Nanoparticles: Physical Properties and Device Applications (Advances in Materials Science and Engineering)

Semiconductor and Metal Nanocrystals: Synthesis and Electronic and Optical Properties (Optical Science and Engineering)

Fabrication of Silicon Microprobes for Optical Near-Field Applications

Defects in Microelectronic Materials and Devices

Semiconductor Quantum Well Intermixing: Material Properties and Optoelectronic Applications: 8 (Optoelectronic Properties of Semiconductors and Superlattice)

CRC Press Microscopy of Semiconducting Materials 1987 Book

Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164

Semiconductor Quantum Dots: Physics, Spectroscopy and Applications (NanoScience and Technology)

Micro-Optics: Elements, Systems And Applications

Physics of Semiconductors and Nanostructures

Microoptics Technology: Fabrication and Applications of Lens Arrays and Devices (Optical Engineering)

Characterization of Nanostructures

Semiconductor Quantum Dots: Physics, Spectroscopy and Applications (NanoScience and Technology)

Elsevier Characterization of Semiconductor Heterostructures

Nanocrystal Quantum Dots

One-Dimensional Microwave Photonic Crystals: New Applications

Semiconductor Nanocrystal Quantum Dots: Synthesis, Assembly, Spectroscopy and Applications

Practical Applications of Microresonators in Optics and Photonics: 1 (Optical Science and Engineering)

Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)

Microelectronic Materials

Optical Microring Resonators: Theory, Techniques, and Applications (Series in Optics and Optoelectronics)

Materials Characterization Techniques

Quantum Dot Optoelectronic Devices: 27 (Lecture Notes in Nanoscale Science and Technology, 27)