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Springer Bias Temperature Instability for Devices and Circuits

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Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
01 October 2016
Listed Since
28 July 2016

Barcode

No barcode data available

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