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Springer Electron Energy-Loss Spectroscopy in the Electron Microscope

Name: Electron Energy-Loss Spectroscopy in the Electron Microscope
Brand: Springer

Analytical Chemistry

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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

Product Specifications

Brand: Springer
Format: Paperback
ASIN: 1489986499
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Analytical Chemistry
Domain: Amazon UK
Release Date: 01 October 2014
Listed Since: 01 October 2014

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Springer Electron Energy-Loss Spectroscopy in the Electron Microscope

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