We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£107.27
Springer High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test: 22A (Frontiers in Electronic Testing, 22A)
Price data checked 1 day ago
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 3 months ago.
£107 today · all-time low £106 (Feb 2026) · usually £108
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 90 days • 90 data points
Price Distribution
Price distribution over 90 days • 3 price levels
Price Analysis
Most common price: £107 (66 days, 73.3%)
Price range: £106 - £108
Price levels: 3 different prices over 90 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1475784740
- Domain
- Amazon UK
- Publication Date
- 26 April 2013
- Listed Since
- 22 September 2013
Barcode
No barcode data available
Similar Products You Might Like
Memory Design Techniques for Low Energy Embedded Systems
Springer
Testing and Reliable Design of CMOS Circuits: 88 (The Springer International Series in Engineering and Computer Science, 88)
Springer
High-Performance Energy-Efficient Microprocessor Design (Integrated Circuits and Systems)
Springer
Embedded Memory Design for Multi-Core and Systems on Chip: 116 (Analog Circuits and Signal Processing, 116)
Springer
Nanometer Technology Designs: High-Quality Delay Tests
Springer
Energy-Efficient Fault-Tolerant Systems (Embedded Systems)
Springer
Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
Springer
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault: 43 (Frontiers in Electronic Testing, 43)
Springer
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing, 34)
Springer
Memory Architecture Exploration for Programmable Embedded Systems
Springer
Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization: 40 (Springer Series in Advanced Microelectronics, 40)
Springer
Emerging Memory Technologies: Design, Architecture, and Applications
Springer
High-Performance CMOS Continuous-Time Filters: 223 (The Springer International Series in Engineering and Computer Science, 223)
Springer
Memories in Wireless Systems (Signals and Communication Technology)
Springer
Multi-Chip Module Test Strategies: 7 (Frontiers in Electronic Testing, 7)
Springer
CMOS Memory Circuits
Springer
Embedded Processor-Based Self-Test: 28 (Frontiers in Electronic Testing, 28)
Springer
Advanced Techniques for Embedded Systems Design and Test
Springer
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Springer
Phase Change Memory: Device Physics, Reliability and Applications
Springer
Emerging Memories: Technologies and Trends
Springer
The Fractal Structure of Data Reference: Applications to the Memory Hierarchy: 22 (Advances in Database Systems, 22)
Springer
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Springer
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Springer