We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£107.27
Springer High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test: 22A (Frontiers in Electronic Testing, 22A)
Price data last checked 41 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£107 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 50 days • 50 data points (No recent data available)
Price Distribution
Price distribution over 50 days • 2 price levels
Price Analysis
Most common price: £107 (30 days, 60.0%)
Price range: £107 - £108
Price levels: 2 different prices over 50 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1475784740
- Domain
- Amazon UK
- Publication Date
- 26 April 2013
- Listed Since
- 22 September 2013
Barcode
No barcode data available
Similar Products You Might Like
Memory Design Techniques for Low Energy Embedded Systems
Springer
Testing and Reliable Design of CMOS Circuits: 88 (The Springer International Series in Engineering and Computer Science, 88)
Springer
High-Performance Energy-Efficient Microprocessor Design (Integrated Circuits and Systems)
Springer
Advances in Electronic Testing: Challenges and Methodologies: 27 (Frontiers in Electronic Testing, 27)
Springer
Embedded Memory Design for Multi-Core and Systems on Chip: 116 (Analog Circuits and Signal Processing, 116)
Springer
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing, 40)
Springer
Nanometer Technology Designs: High-Quality Delay Tests
Springer
Energy-Efficient Fault-Tolerant Systems (Embedded Systems)
Springer
Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
Springer
Memory Controllers for Real-Time Embedded Systems: Predictable and Composable Real-Time Systems
Springer
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault: 43 (Frontiers in Electronic Testing, 43)
Springer
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing, 34)
Springer
Memory Architecture Exploration for Programmable Embedded Systems
Springer
Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization: 40 (Springer Series in Advanced Microelectronics, 40)
Springer
Emerging Memory Technologies: Design, Architecture, and Applications
Springer
High-Performance CMOS Continuous-Time Filters: 223 (The Springer International Series in Engineering and Computer Science, 223)
Springer
Memories in Wireless Systems (Signals and Communication Technology)
Springer
Multi-Chip Module Test Strategies: 7 (Frontiers in Electronic Testing, 7)
Springer
Exploring Memory Hierarchy Design with Emerging Memory Technologies: 267 (Lecture Notes in Electrical Engineering, 267)
Springer
Memories in Wireless Systems (Signals and Communication Technology)
Springer
CMOS Memory Circuits
Springer
Embedded Processor-Based Self-Test: 28 (Frontiers in Electronic Testing, 28)
Springer
Advanced Techniques for Embedded Systems Design and Test
Springer
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Springer