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Springer CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing, 40)

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Description

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
28 October 2010
Listed Since
28 June 2010

Barcode

No barcode data available

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