We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£105.00
Scanning Microscopy 2010
Price data last checked 16 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£105 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 75 days · 75 data points (no recent data)
Price Distribution
Price distribution over 75 days • 1 price levels
Price Analysis
Most common price: £105 (75 days, 100.0%)
Price range: £105 - £105
Price levels: 1 different prices over 75 days
Product Specifications
- Format
- paperback
- ASIN
- 081948217X
- Domain
- Amazon UK
- Release Date
- 15 July 2010
- Listed Since
- 11 August 2010
Barcode
No barcode data available
Similar Products You Might Like
Multimedia on Mobile Devices 2010
Endoscopic Microscopy (Proceedings of SPIE)
Optical Microlithography XX (Proceedings of SPIE)
PIAGENG 2010: Photonics and Imaging for Agricultural Engineering
Optical Microlithography XXI (Proceedings of SPIE)
Optoelectronic Integrated Circuits X: 10 (Proceedings of SPIE)
Icono 2010: International Conference on Coherent and Nonlinear Optics
Icmit 2009: Mechatronics and Information Technology (Proceedings of SPIE)
Tenth International Conference on Correlation Optics
Nano- and Micro-metrology (Proceedings of SPIE)
Optical Sensing and Detection
Industrial and Commercial Applications of Smart Structures Technologies 2010
Optical Scattering: Measurement and Analysis (Press Monographs)
Wiley
Organic Photonic Materials and Devices X: 10 (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)
Optical Microlithography XIX (Proceedings of SPIE)
Three-dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV (Proceedings of SPIE)
Unconventional Imaging (Proceedings of SPIE)
Illumination Optics (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XX: 20 (Proceedings of SPIE)
Optical Modelling and Design
Optical Interactions with Tissues and Cells XXI
Random House Books for Young Readers
Optical Pattern Recognition XV (Proceedings of SPIE)
