We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
This item is currently unavailable
Optical Measurement Systems for Industrial Inspection: III (Proceedings of SPIE)
Price data last checked 153 day(s) ago - refreshing...
One email. No newsletter. No nudges.
Gone for 179 days. Could come back at any time — we're watching for you.
Out of stock 179 days · last price £115 · longest previous gap was 1 days
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 578 days • 578 data points (No recent data available)
Price Distribution
Price distribution over 578 days • 1 price levels
Price Analysis
Most common price: £115 (578 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 578 days
Product Specifications
- Format
- paperback
- ASIN
- 0819450146
- Domain
- Amazon UK
- Release Date
- 31 May 2003
- Listed Since
- 04 January 2007
Barcode
No barcode data available
Similar Products You Might Like
Optical Diagnostics and Sensing IV: 4 (Proceedings of SPIE)
Optical Metrology and Inspection for Industrial Applications II: 5-7 November 2012, Beijing, China (Proceedings of SPIE): No. 8563
Industrial Applications of Optical Inspection, Metrology, and Sensing: 19-20 November 1992, Boston, Massachusetts (Proceedings of S P I E)
Optical Design and Engineering II (SPIE Conference Proceedings) (Proceedings of SPIE)
Integrated Optics: Theory and Applications (SPIE Conference Proceedings) (Proceedings of SPIE)
Three-Dimensional Imaging, Optical Metrology, and Inspection: V (Proceedings of SPIE): 3835 (Proceedings of Spie--The International Society for Optical Engineering, V. 3835.)
Detectors and Associated Signal Processing II (SPIE Conference Proceedings) (Proceedings of SPIE)
Optical Materials and Structures Technologies (Proceedings of SPIE) (Proceedings of Spie Volume 5179)
Optical Spectroscopic Techniques, Remote Sensing, and Instrumentation for Atmosphere and Space Research IV: Vol 4485: Vol 4485 (Proceedings of Spie)
Optical Test and Measurement Technology and Equipment: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China (Proceedings of SPIE)
Optically Based Materials and Optically Based Biological and Chemical Sensing for Defence II (SPIE Conference Proceedings) (Proceedings of SPIE)
Technologies for Optical Countermeasures II and Femtosecond Phenomena (SPIE Conference Proceedings) (Proceedings of SPIE)
Integrated Optics: Devices, Materials, and Technologies XVII (Proceedings of SPIE): No. 8627
Optical Transmission, Switching, and Subsystems: III (SPIE Conference Proceedings) (Proceedings of SPIE)
Nano- and Micro-optics for Information Systems (Proceedings of SPIE)
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-optical Devices and Systems (Proceedings of SPIE)
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments (The International Society ... Engineering Proceedings of SPIE): No. 8197
Nonlinear Optics Applications (SPIE Conference Proceedings) (Proceedings of SPIE)
Intelligent Systems in Design and Manufacturing VI (SPIE Conference Proceedings) (Proceedings of SPIE)
Optical Microlithography: Volume XXIV: 1-3 March 2011, San Jose, California, United States (Proceedings of SPIE)
Current Developments in Lens Design and Optical Engineering: Pt. VII (Proceedings of SPIE)
Micromachining Technology for Micro-optics and Nano-optics IV (Proceedings of SPIE)
International Conference on Applications of Optics and Photonics: 3-7 May 2011 Braga, Portugal (Proceedings of SPIE)