Technologies for Optical Countermeasures II and Femtosecond Phenomena (SPIE Conference Proceedings) (Proceedings of SPIE)

Photonics Applications in Industry and Research IV (SPIE Conference Proceedings) (Proceedings of SPIE)

Integrated Optics: Theory and Applications (SPIE Conference Proceedings) (Proceedings of SPIE)

Photonic Applications in Nonlinear Optics, Nanophotonics, and Microwave Photonics (SPIE Conference Proceedings) (Proceedings of SPIE)

Optical Transmission, Switching, and Subsystems: III (SPIE Conference Proceedings) (Proceedings of SPIE)

Micromachining Technology for Micro-optics and Nano-optics IV (Proceedings of SPIE)

Integrated Optics: Devices, Materials, and Technologies XVII (Proceedings of SPIE): No. 8627

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Advanced Fabrication Technologies for Micro/Nano Optics and Photonics (Proceedings of SPIE)

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Technologies for Optical Countermeasures: Volume IX: 26-27 September 2012, Edinburgh, United Kingdom

Ultrafast Phenomena and Nanophotonics XVII (Proceedings of SPIE): No. 8623

Optics and Photonics for Information Processing V (The International Society for Optical Engineering Proceedings of SPIE): 8134

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Ultrafast Phenomena and Nanophotonics XVI: 22-25 January 2012, San Francisco, California, United States (Proceedings of SPIE)

International Conference on Optical Instruments and Technology 2008: Optical Systems and Optoelectronic Instruments (Proceedings of Spie)

Physics and Simulation of Optoelectronic Devices XVII (Proceedings of SPIE): v. 7211

International Conference on Optical Instruments and Technology 2008: Microelectronic and Optoelectronic Devices and Integration (Proceedings of Spie)

Tabletop Intense Femtosecond Pulse Sources and Their Applications

Springer

Advanced Fabrication Technologies for Micro/nano Optics and Photonics VI: 5-6 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8613

Advanced Optical Concepts in Quantum Computing, Memory, and Communication II (Proceedings of SPIE): v. 7225

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Springer

Optoelectronic Materials and Devices III: 27-30 October 2008, Hangzhou, China (Proceedings of SPIE)

Optical Design and Testing V: 5-7 November 2012 Beijing, China (Proceedings of SPIE): No. 8557