£130.00

Selected Papers on Interferometry (Spie Milestone Series, Vol 28)

Applied Optics

Price data last checked 18 day(s) ago - will refresh soon

View at Amazon

Price History & Forecast

Last 73 days • 73 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 73 days • 1 price levels

Days at Price

Price Analysis

Most common price: £130 (73 days, 100.0%)

Price range: £130 - £130

Price levels: 1 different prices over 73 days

Product Specifications

Format: paperback
ASIN: 0819405736
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 15 June 2006
Listed Since: 17 October 2006

Barcode

No barcode data available

Selected Papers on Interferometry (Spie Milestone Series, Vol 28)

Price History & Forecast

Price Distribution

Price Analysis

Product Specifications

Barcode

Similar Products You Might Like

Selected Papers on Effects of Aberrations in Optical Imaging (SPIE milestone series)

Selected Papers on Diffraction Gratings (SPIE milestone series)

Selected Papers on Adaptive Optics and Speckle Imaging (SPIE milestone series)

Selected Papers on Optical Parametric Oscillators and Amplifiers and Their Applications (SPIE milestone series)

Selected Papers on Optical Tolerancing (Spie Milestone Series, Vol 36)

Selected Papers on Laser Design (Spie Milestone Series, Vol 29)

Selected Papers on Visual Communication: Technology and Applications (SPIE Milestone Series)

Applications of Digital Image Processing XXVIII (Proceedings of SPIE)

Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)

Optical Microlithography XXI (Proceedings of SPIE)

Selected Papers on Optical Interconnects and Packaging (SPIE milestone series): v. MS 142

Selected Papers on Rare-Earth-Doped Fiber Laser Sources and Amplifiers (SPIE Milestone Series)

Selected Papers on Optical Transfer Function: Foundation and Theory (SPIE Milestone Series)

Nano- and Micro-metrology (Proceedings of SPIE)

Optical Microlithography XIX (Proceedings of SPIE)

Optomechatronic Actuators and Manipulation (Proceedings of SPIE)

Optomechatronic Systems Control (Proceedings of SPIE)

Endoscopic Microscopy (Proceedings of SPIE)

Optomechatronic Technologies 2008 (Proceedings of SPIE)

Stereoscopic Displays and Applications XIX (Proceedings of SPIE)

Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)

Advances in Metrology for X-ray and EUV Optics (Proceedings of SPIE)

Optical Manipulation Conference (Proceedings of SPIE)

Optomechatronic Micro/nano Devices and Components (Proceedings of SPIE)